Gallium Antimonide (GaSb) Substrates
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“100mm (4”) GaSb Substrates from Galaxy”
FastFPA Presentation - October 2009

Specifications Description Tolerance
Orientation <100> ; <111>;
alternatives available

Standard: ± 0.5°
Doping / Carrier
Concentrations
n-type: Tellurium
undoped: p-type

n-type: 1E15 - 4E18/cm3
p-type: undoped, residual is
2-3E16/cm3

Diameter Production: up to 100 mm
Development: 125 mm

Standard:
± 0.4 mm on circles


Wafer Diameter
75 mm
100 mm
PV, front surface flatness
< 5 μm
< 5 μm
Total Thickness Variation
< 5 μm
< 10 μm
EPD / cm2
< 1000
< 1000
Minor / Major flat lengths: EJ, SEMI- or Customer Spec